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Electromagnetic compatibility optimization: the added value offered by AMET.

Thanks to techniques such as FEM, MoM or PEEC we are able to provide EMC support for the improvement of electronic devices. By combining experimental data with simulated data, problem analysis is thus facilitated, reducing development times.

AMET with more than twenty years in the field of simulations can offer you the best solution for the EMC optimization of your product!

Find out more:

https://www.amet.it/en/solutions/virtual-analysis-cae/#EMC